- Manufacture :
- Series :
- Part Status :
- Operating Temperature :
- Supplier Device Package :
- Supply Voltage :
- Logic Type :
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- - (1)
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Buffer/Driver with Parity (1)
- Programmable Terminator (2)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceivers (2)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (2)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (2)
- Applied Filters :
14 results
| Picture | Mfr Part # | Unit Price | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | ||||||||||||||||||
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RFQ |
4,160
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
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RFQ |
3,319
In-stock
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ON Semiconductor | GPIB COMPATIBLE OCTAL TRANSCEIV | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 8 | - | |||
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5,187
In-stock
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Texas Instruments | IC TERMINATOR PROG DUAL 14-DIP | 4000B | Active | Tube | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP | 3 V ~ 18 V | 8 | Programmable Terminator | ||||
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RFQ |
3,666
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
3,188
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
2,806
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
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RFQ |
2,846
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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RFQ |
5,810
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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RFQ |
4,817
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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RFQ |
4,739
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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RFQ |
5,609
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
4,795
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
5,663
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
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4,394
In-stock
|
Texas Instruments | IC TERMINATOR PROG DUAL 14-DIP | 4000B | Active | Tube | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP | 3 V ~ 18 V | 8 | Programmable Terminator | ||||
