- Manufacture :
- Part Status :
- Packaging :
- Operating Temperature :
- Mounting Type :
- Package / Case :
-
- 14-DIP (0.300", 7.62mm) (2)
- 14-SOIC (0.154", 3.90mm Width) (7)
- 14-SOIC (0.209", 5.30mm Width) (3)
- 14-TSSOP (0.173", 4.40mm Width) (6)
- 16-DIP (0.300", 7.62mm) (1)
- 16-SOIC (0.154", 3.90mm Width) (3)
- 24-DIP (0.300", 7.62mm) (11)
- 24-SOIC (0.295", 7.50mm Width) (30)
- 28-BSSOP (0.295", 7.50mm Width) (12)
- 28-SOIC (0.295", 7.50mm Width) (14)
- 48-BSSOP (0.295", 7.50mm Width) (5)
- 48-TFSOP (0.173", 4.40mm Width) (12)
- 48-TFSOP (0.240", 6.10mm Width) (13)
- 52-QFP (10)
- 56-VFBGA (8)
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (5)
- Buffer/Driver with Parity (3)
- Embedded Test-Bus Controllers (4)
- IEEE STD 1284 Translation Transceiver (10)
- LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver (28)
- Programmable Terminator (18)
- Scan Test Device with Buffers (5)
- Scan Test Device with Bus Transceiver and Registers (15)
- Scan Test Device with Bus Transceivers (7)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (6)
- Scan Test Device with D-Type Latches (5)
- Scan Test Device with Inverting Buffers (6)
- Scan Test Device with Registered Bus Transceiver (11)
- Schottky Barrier Diode Bus-Termination Array (3)
- TTL/BTL Registered Transceiver (6)
- TTL/BTL Transceiver/Translator (4)
- Applied Filters :
137 results
| Picture | Mfr Part # | Unit Price | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | ||||||||||||||||||
|
|
RFQ |
4,160
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
RFQ |
3,801
In-stock
|
ON Semiconductor | TXRX BIDIRECT IEEE 48TSSOP | 74VHC | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 4.5 V ~ 5.5 V | 8 | IEEE STD 1284 Translation Transceiver | |||
|
|
RFQ |
5,125
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
|
RFQ |
5,983
In-stock
|
Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
|
RFQ |
3,746
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | |||
|
|
|
RFQ |
4,093
In-stock
|
Texas Instruments | IC 8-BIT TTL/BTL REG XCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
|
RFQ |
5,648
In-stock
|
Texas Instruments | IC 8-BIT TXCVR 52-QFP | 74FB | Obsolete | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | |||
|
|
RFQ |
3,319
In-stock
|
ON Semiconductor | GPIB COMPATIBLE OCTAL TRANSCEIV | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 8 | - | |||
|
|
RFQ |
3,582
In-stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
|
RFQ |
3,743
In-stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
|
5,509
In-stock
|
Texas Instruments | IC TXRX 8BIT TTL/BTL 52-QFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | ||||
|
|
|
3,519
In-stock
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
|
|
|
4,912
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
|
|
|
5,029
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||||
|
|
|
4,371
In-stock
|
Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 74FB | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.75 V ~ 5.25 V | 8 | TTL/BTL Registered Transceiver | ||||
|
|
|
2,972
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
|
|
4,644
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
|
|
|
4,187
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||||
|
|
|
4,307
In-stock
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
|
|
|
4,015
In-stock
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||||
|
|
|
5,343
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
|
|
|
5,168
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
|
|
4,054
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
|
|
4,497
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||||
|
|
3,391
In-stock
|
Texas Instruments | IC SCHOTTKY BARRIER DIODE 16SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
|
4,588
In-stock
|
Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tube | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
|
5,829
In-stock
|
Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 74F | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | - | 8 | Schottky Barrier Diode Bus-Termination Array | ||||
|
|
5,187
In-stock
|
Texas Instruments | IC TERMINATOR PROG DUAL 14-DIP | 4000B | Active | Tube | -55°C ~ 125°C | Through Hole | 14-DIP (0.300", 7.62mm) | 14-PDIP | 3 V ~ 18 V | 8 | Programmable Terminator | ||||
|
|
|
RFQ |
3,666
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
|
RFQ |
3,188
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
