- Manufacture :
- Part Status :
- Packaging :
- Logic Type :
-
- Addressable Scan Ports (4)
- Parity Generator/Checker (12)
- Scan Test Device with Bus Transceiver and Registers (15)
- Scan Test Device with Bus Transceivers (6)
- Scan Test Device with Inverting Bus Transceivers (6)
- Scan Test Device with Registered Bus Transceiver (13)
- Scan Test Device With Transceivers And Registers (2)
- Scan Test Device with Universal Bus Transceivers (4)
- Applied Filters :
62 results
| Picture | Mfr Part # | Unit Price | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | ||||||||||||||||||
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RFQ |
4,850
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
3,273
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
5,734
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
3,356
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
5,163
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
3,560
In-stock
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
5,125
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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3,244
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||||
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5,918
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||||
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4,859
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
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5,739
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
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4,912
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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4,644
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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5,343
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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4,054
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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4,704
In-stock
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Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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5,543
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
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2,962
In-stock
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Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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RFQ |
4,438
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.5x11.5) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
3,269
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
5,305
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28PLCC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.5x11.5) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
4,089
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
2,827
In-stock
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
5,911
In-stock
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
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RFQ |
3,688
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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RFQ |
3,191
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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RFQ |
4,546
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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RFQ |
4,239
In-stock
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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RFQ |
5,954
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
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RFQ |
5,420
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
