- Series :
- Packaging :
- Supply Voltage :
- Logic Type :
-
- ABT Scan Test Device With Transceivers and Registers (5)
- ABT Scan Test Device With Universal Bus Transceivers (11)
- Linking Addressable Scan Ports (1)
- Scan Test Device with Registered Bus Transceiver (2)
- Scan Test Device With Transceivers And Registers (6)
- Scan Test Device with Universal Bus Transceivers (2)
- Applied Filters :
27 results
Picture | Mfr Part # | Unit Price | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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GLOBAL STOCKS | ||||||||||||||||||
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5,479
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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4,075
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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5,173
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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4,859
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
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5,739
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
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2,728
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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4,042
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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2,737
In-stock
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Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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2,930
In-stock
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Texas Instruments | IC 18BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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5,212
In-stock
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Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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3,771
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
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5,544
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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4,346
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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5,989
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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3,253
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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3,851
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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3,952
In-stock
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Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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2,854
In-stock
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Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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5,631
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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2,722
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||||
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4,133
In-stock
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Texas Instruments | IC LINK ADDRSS SCAN-PORT 64-LQFP | 74LVT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | - | Linking Addressable Scan Ports | ||||
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3,601
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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5,042
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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5,851
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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5,513
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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5,657
In-stock
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Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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3,043
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers |