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35 results
| Picture | Mfr Part # | Unit Price | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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5,029
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||||
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2,972
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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4,187
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||||
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5,168
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
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4,037
In-stock
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Texas Instruments | IC MEMORY DECODER 20SOIC | 74BCT | Active | Tube | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | ||||
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4,497
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||||
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2,879
In-stock
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Texas Instruments | IC DECODER MEM DUAL 2-4 20-DIP | 74BCT | Active | Tube | 0°C ~ 75°C | Through Hole | 20-DIP (0.300", 7.62mm) | 20-PDIP | 4.5 V ~ 5.5 V | - | Memory Decoder | ||||
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RFQ |
3,666
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
3,188
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
5,317
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
5,250
In-stock
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
2,806
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
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RFQ |
4,454
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
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RFQ |
5,808
In-stock
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
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RFQ |
2,846
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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RFQ |
5,810
In-stock
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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RFQ |
4,817
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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RFQ |
4,739
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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RFQ |
3,959
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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RFQ |
5,609
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
4,795
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
4,312
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
5,215
In-stock
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
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RFQ |
5,663
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
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RFQ |
4,580
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
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RFQ |
2,750
In-stock
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
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RFQ |
4,209
In-stock
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Texas Instruments | IC DECODER MEM DUAL 2-4 20-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | |||
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4,399
In-stock
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Texas Instruments | IC MEMORY DECODER 20-SOIC | 74BCT | Active | Tube | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | ||||
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RFQ |
5,978
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
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RFQ |
5,241
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
